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ISSN 2080-8755 eISSN 2353-9607

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Vol. 9, No. 1

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International Journal of
Microelectronics and Computer Science
2018, Volume 9, Number 1


ISSN 2080-8755
eISSN 2353-9607

Table of Contents

  • Analysis and Investigation of Schottky Barrier MOSFET Current Injection with Process and Device Simulation
    M. Schwarz, L.E. Calvet, J.P. Snyder, T. Krauss, U. Schwalke and A. Kloes
  • Exact Parallel Critical Path Fault Tracing to Speed-Up Fault Simulation in Sequential Circuits
    J. Kõusaar, S. Kostin, R. Ubar, S. Devadze and J. Raik
  • Frequency Domain Non-Linear Compact Modelling and Simulation of IC Spiral Inductors on Silicon
    M. Brinson
  • Modeling of Vibrating Angular Motion Sensor in Matlab/SIMULINK
    J. Nazdrowicz
  • VHDL-AMS Models for Current Conveyor Based Monolithic Operational Amplifiers
    I. M. Pandiev
     

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